aINTERNATIONAL
asdasaasdasdasdSEMICONDUCTOR
dsaasdasdasdaddsaasdasdasdasdCONFERENCEdaa


 



 

Monday, October 13, 11:30, Room "A"

PLENARY  SESSION 2
(Invited Speakers)
Session P2: Oral presentation

Chair:
P. Godignon, CNM-IMB-CSIC, Barcelona, Spain.
G. Brezeanu, “Politehnica” University of Bucharest, Romania

P2.1 11:30

GENERALISED DC CHARACTERISTICS OF GATE-CONTROLLED DIODES IN AVALANCHE BREAKDOWN REGIME, A. Rusu1, M. Badila2, C. Bulucea3, 1“Politehnica” Univ. of Bucharest, Romania, 2Catalyst Semiconductor Inc., 3National Semiconductor Co., CA, USA.

P2.2 12:00

CMOS TEMPERATURE SENSORS-CONCEPTS, STATE-OF-THE-ART AND PROSPECTS,
F. Udrea, S. Santra, J.W. Gardner*, Engineering Department, Univ. of Cambridge, *School of Engineering, Univ. of Warwick, UK.

P2.3 12:30

WILL THE CAS TOPICS FOLLOW THE EVOLUTION OF IMT, NOW AT ITS 15th ANNIVERSARY?, D. Dascalu, IMT-Bucharest, Romania.

13:00-13:15 PHOTO REMEMBER CAS 2008
in front of the Sinaia Hotel

13:30-14:30 LUNCH


  
About Us | Site Map | Contact Us |
IMT - Bucharest 32B, Erou Iancu Nicolae Street, R- 077190 , Bucharest, ROMANIA
Mailing address: PO-BOX 38-160, 023573 , Bucharest, ROMANIA; Tel: +40-21-490.82.12; +40-21-490.84.12; +40-21-490.85.83; +40-21 -490.82.03; Fax: +40-21-490.82.38; +40-21-490.85.82