Status - general view summer 2009
upgrade the 1-65 GHz set-up for on wafer characterization up to 110 GHz (topics A1, A2);
to purchase a frequency synthesiser up to 65GHz for testing the receivers and circuits for identification applications in the millimetre wave range (MMID) were amplitude modulation is necessary (topics A1, A2);
to purchase a near field scanning optical microscope for quantitative evaluation of surfaces in the 1-10 nm range (with a particular emphasis on understanding organic multicomponent films -research topics B1) and nanostructures (topic B2) and to image the complex optical field distribution on the surface of sub-100 nm sized metal particles excited into plasmon nanodevices (research topic B2);
to purchase an Au plating facility to be used for electro-deposition on semiconductor materials (topics A1-A3, B1);