Buton.jpg (695 bytes)  First name: Marius

Buton.jpg (695 bytes)  Surname: Bazu

Buton.jpg (695 bytes)  Date and place of birth: October 12, 1948 / Ploiesti, Romania

Buton.jpg (695 bytes)  Education: Electronics Department of the University Politehnica Bucharest (1971), PhD from the University Politehnica Bucharest (1994)

Buton.jpg (695 bytes)  Professional experience: Reliability of microelectronic devices, design and semiconductor physics of electronic components. He developed in Romania the accelerated reliability tests and building-in reliability & concurrent engineering approaches.

Buton.jpg (695 bytes)  Present position: Head of the Reliability Laboratory and Scientific Secretary of IMT-Bucharest.

Buton.jpg (695 bytes)  Research interests: Methods of reliability prediction, failure physics for microsystems & microelectronic devices, synergetic approach of reliability assurance, use of computational intelligence methods for reliability assessment of microsystems.

Buton.jpg (695 bytes)  Past and current projects: Leader of an european project Phare/TTQM (with partners from Romania and Greece) on a building-in reliability technology (1997-1999).

Buton.jpg (695 bytes)  Main scientific publications:


wpe5.jpg (680 bytes)  Titu I. Bajenescu, Marius Bāzu - "Reliability of Electronic Components", Springer Verlag 1999, ISBN 3-540-65722-3, 550 pp.
wpe5.jpg (680 bytes)  M. Bāzu, I. Bacivarof "On the validity of the Arrhenius model in the accelerated testing of semiconductor device reliability", Reliability Achievement, Elsevier Applied Science, pp. 151-155, 1989, 230 pp.

Papers in periodicals and contributions to conferences: Author or co-author of more than 120 scientific papers (IEEE Trans.on Reliability, Journal of Electrochem.Soc, Journal of the Institute of Environmental Sciences, Solid State Phenomena, etc) and contributions to conferences (Annual Reliability and Maintainability Symp. (USA, 1991), Probabilistic Safety Assessment and Management (USA, 1991), MESSCOMP (Germany, 1994), Scandinavian Reliability Engineers Symposium (Norway, 1989, Sweden, 1990), ESREL (France - 1994 and Germany -1999), etc.).

Some examples:

wpe5.jpg (680 bytes)  M. Bāzu - "An attempt to use the physics of failure in reliability prediction procedures" , IEEE Trans. on Reliability, pp.307-311, June 1995.
wpe5.jpg (680 bytes)  M. Bāzu - "Reliability assessment based on fuzzy logic", Conference on Computational Intelligence for Modelling, Control & Automation (CIMCA’99), Vienna (Austria), 17-19 February 1999.
wpe5.jpg (680 bytes)  M. Bāzu, F. Gaiseanu, R. Plugaru "Ein System fur Zuverlassigkeitsaussage und Zeitraffungsprufung", MESSCOMP, Wiesbaden (Germany), Sept.1994.
wpe5.jpg (680 bytes)  T. Bajenescu, M. Bazu "Semiconductor device reliability: an overview", European Safety and Reliability Conference (ESREL’99), Munich (Germany), 13-17 Sept. 1999
wpe5.jpg (680 bytes)  M. Bāzu, M. Tazlauanu - "Reliability testing of semiconductor devices in humid environment", Annual Reliability and Maintainability Syimposium (ARMS), Orlando, Florida (SUA), 29-31 Jan. 1991.
wpe5.jpg (680 bytes)  M. Bāzu, I. Bacivarof " A method of reliability evaluation of accelerated aged electron components ", Probabilistic Safety Assessment and Management (PSAM), Beverly Hills, California (SUA), 4-7 Feb. 1991.
wpe5.jpg (680 bytes)  M. Bāzu, V. Ilian " Accelerated Testing of IC's after a Long Term Storage", SRE Symposium, Nykoping (Suedia), Oct. 1990.

Buton.jpg (695 bytes)  Member of professional associations:

wpe5.jpg (680 bytes)  Member of the association International Electrical and Electronic Engineers (IEEE)
wpe5.jpg (680 bytes)  Referent of the journal IEEE Transactions on Reliability
wpe5.jpg (680 bytes)  Member of the Romanian Association for Reliability.

Buton.jpg (695 bytes)  Additional information:

wpe5.jpg (680 bytes)  Chairman of some international conferences: CIMCA 1999 (Vienna, Austria), CAS 1991-2002 (Sinaia, Romania).
wpe5.jpg (680 bytes)  Technical Programme Vice-Chair of the International Semiconductor Conference (CAS 2000-2002)
wpe5.jpg (680 bytes)  Chief-editor of the publications: "Electronic Components" (1987-1989) and "Optimum Q" (1990-1991).
wpe5.jpg (680 bytes)  Deputy chief-editor of "Micro and Nanotechnologies Bulletin" (2002-2002)
wpe5.jpg (680 bytes)  2000 Prize of the General Association of the Engineers form Romania.

Buton.jpg (695 bytes)  Foreign languages: French, English

Buton.jpg (695 bytes)  Contact information:

wpe5.jpg (680 bytes)  E-mail:,
wpe5.jpg (680 bytes)  Tel: +40-21-490.84.12, fax: +40-21-490.82.38.  

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