CURRICULUM VITAE 

  First name: Coraci

  Surname (Family name): Antonie

  Date and place of birth: August 17^th 1945, Craiova, Romania;

  Education: M.Sc, Faculty of Physics, Bucharest University, (Section Solid State Physics), 1968;

  Professional experience:

  condensed matter;
  evaporation and sputtering thin film technology;
  wet and dry etching of silicon, silicon dioxide, and oxinitride;
  UV photolithographical processes;
  chemical and thermal annealing processes;
  solar cells based on CIS thin films technology;
  ferromagnetic and magnetoresitive thin film technologies;
  metal silicide technology;
  surface and bulk microprocessing of silicon for MEMS, and microfluidic applications.

  Career:

  Technologist engineer in Power Silicon Rectifiers Dept. from IPRS - Baneasa, 1968-1975;
  Sen. Res. IMT - Bucharest, Technology Laboratory, Dept. D-6, 1975-present.

  Stages abroad: France, by IPRS-Baneasa for technical stage, nov.1969-feb. 1970, and may 1974- june 1974.

  Present position: Sen. Res. IMT – Bucharest, Technology Laboratory, Dept. D-6, 1975- present

  Research interests:

  silicon surface and bulk microprocessing for MEMS, or "Lab-On-Chip" (chemical and biomedical) applications;
  design and fabrication of the microchannel test structures in/on silicon used for fluid flow and heat transfer applications;
  microprocessing of AlN, and SiO nanostructured thin films.

  Past and current projects:

  "Solid State Chemical Detectors ", 1992-1996, prticipant;
  "Tehnologies for obtaining and microprocessing of the piezoelectric nanostructured AiN thin films", Matnantech program, Subprogramme 8 project responsible, F. Craciunoiu), in present, participant;
  "Reconfigurable optical neuron-research, demonstrator experimentation and parameters evaluation", Matnantech program, Subprogramme 7 (project responsible, Gabriel-Moagar Poladian), in present, participant.

  Main scientific publications:

  Papers in periodicals:

  Multilayer metallization structures with TiN and TiSi₂ prepared by multipulse laser irradiation", (V. Craciun, I. N. Mihailescu, I. Ursu, F. Craciunoiu, A. Coraci, G. Leggieri, A. Luches, V. Nassisi, and M. Martino), Applied Physics Letters, Vol. 52, No. 15, p. 1225-1227, 1988;
  "Magnetoresistive properties and microstructure of NiFe thin films and NiFe(t)/Cu(s)/NiFe(t) multilayer films", (Jenica Neamtu, M. Volmer, A. Coraci), Thin Solid Films, Vol. 343-344, p. 218-221, 1999;
  "Visible luminescence of erbium oxide layers grown on crystalline and amorphous silicon", (E. Nogales, B. Mendez, J. Piqueras, Rodica Plugaru, A. Coraci, and J. A. Garcia), J. Phys. D: Appl. Phys. P. 35, 2002.

  Other contributions:

  "multilayer metallization structure prepared by multipulse laser irradiation", (G. Leggieri, A. Luches, V. Nassisi, M. Martino, I. Ursu, V. Craciun, I. N. Mihailescu, F. Craciunoiu, A. Coraci), First Greece-Italy International Conference on New Laser Technologies and Applications, p. 62, Grecia, 1988;
  "Si MESFET Technological Process",, (Anca Angelescu, A. Coraci, Irina Kleps, Cecilia Codreanu, Aurelia Rascol,L. Vladescu), Proc. of the 16^th Int. Semicond. Conf., CAS’ 93 , p. 469-472, Romania 1993;
  "Planarization techniques in GaAs processing", (A. Muller, R. Rizescu, Ioana Petrini, V. Avramescu, A. Coraci, F. Craciunoiu), Proc. of the 18^th Int. Semicond. Conf., CAS’ 95, p. 343-346, Romania, 1995;
  "Passive devices on GaAs substrate for MMICs applications", (A. Muller, S. Simion, M. Dragoman, S. Iordanescu, Ioana Petrini, C. Anton, D. Vasilache, V. Avramescu, A. Coraci, F. Craciunoiu), Proc. of the 19^th Int. Semicond. Conf., CAS’ 96, Vol. 1, p. 185-188, Romania, 1996;
  "An IR micromachined Fabry-Perot interferometer", (A. Coraci, F. Craciunoiu, S. Nan, Monica Simion), Proc. of Microvawe and Optoelectronics Conf., MIOP’ 97, p. 164-167, Germany, 1997;
  "Two alternative pixel arrays of high energy particle detector", (A. Coraci, V. Avramescu, Monica Simion), Eurosensors XI, Vol. 3, p. 1555-1558, Poland, 1997;
  "CuInSe₂ Thin Films for Solar Cells", (Paula Obreja, A. Coraci, O. Radovici), Proc. of the 20^th Int. Semicond. Conf., Vol. 2, p. 475-478, Romania, 1997;
  "Preparation and Properties of Electrodeposited InSe and CuSe Thin Films", (Paula Obreja, A. Coraci, O. Radovici), Proc. of the 21th Int. Semicond. Conf., CAS’ 98, Vol. 1, p. 233-236, Romania, 1998;
  "Magnetic and Microstructural Properties of NiFe/CuFe Films", (Jenica Neamtu, M. Volmer, A. Coraci), 7^th European Magnetic Materials and Applications Conf., p. 68, Spain;
  "A 2-D micromachined sensor for the IR gas analyser", (A. Coraci, C-G Bostan, Monica Simion, C-P Ganea), Proc. of MME’ 98, p. 210-213, Norway, 1998;
  "Magnetoresistive properties of permalloy thin films and permalloy/Cu multilayers", (Jenica Neamtu, M. Volmer, A. Coraci), Proc. of the 21th Int. Semicond. Conf., CAS’ 98, Vol. 1, p. 213-216, Romania, 1998;
  "Characterization of electrodeposited CuInSe₂ thin films and related materials", (Paula Obreja, Mihaela Ghita, A. Coaci), Proc. of the European Materials Conf., EMRS’ 99, paper reference: O-PS I/P15, France, 1999.

  Foreign languages: English, French.

  Contact information: [email protected]; Tel, fax, mailing address – IMT Bucharest.