CURRICULUM VITAE

Buton.jpg (695 bytes)  First name: Mihai

Buton.jpg (695 bytes)  Surname (Family name) Danila

Buton.jpg (695 bytes)  Date and place of birth: 12.03.1967, Buzau, jud. Buzau

Buton.jpg (695 bytes)  Education (B.Sc / M.Sc / Ph.D; institution, specialization, year of graduation):

wpe5.jpg (680 bytes)  Fac. of Physics, Univ. Bucuresti (1990 Tehnological Physics), Electronic Materials;
wpe5.jpg (680 bytes)  Ph.D student, Univ. Bucuresti, Fac. of Physics, Solid State Physics (Condensed Matter Physics) (1.XI.2001), prof. I. Licea
wpe5.jpg (680 bytes)  IFIN-HH Diploma nr45/2477 26.06.1988
wpe5.jpg (680 bytes)  CNCAN : Level 2 Licence for working with Nuclear Radiations nr. 148/2000

Buton.jpg (695 bytes)  Professional experience: Optoelectronics, X-ray analysis methods

wpe5.jpg (680 bytes)  Profile analysis of X-ray spectra (polycrystals, bulk + thin films 10 -0.1mm):

wpeB.jpg (687 bytes)  lattice parameters;
wpeB.jpg (687 bytes)  phase composition (qualitative and quantitative)
wpeB.jpg (687 bytes)  grain size (1-3 < Dhkl < 0.1mm);
wpeB.jpg (687 bytes)  structural changes (Dd/d >10-7);
wpeB.jpg (687 bytes)  texture (preffered nanocrystallite orientation)
wpeB.jpg (687 bytes)  crystalline fraction (for mixed amoprhous-crystalline phases).
wpeB.jpg (687 bytes)  Internall residual stress of first and second order;

wpe5.jpg (680 bytes)  Investigation of monocrystalline materials (including thin films):

wpeB.jpg (687 bytes)  elastic strain determination;
wpeB.jpg (687 bytes)  lattice misfit ant tetragonal distortion for heteroepitaxial layers;
wpeB.jpg (687 bytes)  monocrystalline wafer curvature determination;
wpeB.jpg (687 bytes)  layer thickness;
wpeB.jpg (687 bytes)  damage distributions in monocrystalline structures (used in pressure sensors, micro and nano electro-opto-mechanical systems);
wpeB.jpg (687 bytes)  determination of crystallographic orientation of monocrystals

wpe5.jpg (680 bytes)  Computer tehniques used for X-ray spectra corrections and data extraction: texture, crystallinity, grain size, residual stress, first and second order tensions

The Nuclear Unit of IMT had also a set of specific software developed at Oak Ridge National Laboratory (sent by the author Camden R. Hubbard from ORNL, leader of Diffraction and Thermophysical Properties Group): XRAYL (a program for producing idealized powder diffraction line profiles from overlapped powder profiles) and CRYSIZ (a programm for computing crystallite size from the broadening of powder diffraction lines). In IMT, the program CRYSIZ is used to perform the modern Waren Averbach method of X-ray analysis of computing size and strain distributions, especially for the nanostructured materials.

Buton.jpg (695 bytes)  Career:

wpe5.jpg (680 bytes)  1991-1997 ICCE Optoelectronics LAB.
wpe5.jpg (680 bytes)  1997- present IMT , Head of the Nuclear Unit of IMT

Buton.jpg (695 bytes)  Present position: Researcher (CS), Head of the Nuclear Unit "Laboratory of X-ray difractometry"

Buton.jpg (695 bytes)  Research interests:

wpe5.jpg (680 bytes)  X-rays analysis of processes and materials;
wpe5.jpg (680 bytes)  Thin films : transition from amorphous to nanocrystalline phase, grain size, second order stresses and misfit, thickness measurement with X-rays;
wpe5.jpg (680 bytes)  Structural quantitative characterisation and identification of nano-phases and crystalline materials by X-ray methods and tehniques;

Buton.jpg (695 bytes)  Past and current projects:

wpe5.jpg (680 bytes)  Past:

wpeB.jpg (687 bytes)  Bipolar heterojunction InP/InGaAs transistors, head of the project, 1997-1999
wpeB.jpg (687 bytes)  High efificiency photovoltaic conversion elements, prototype solar cell head of the project, 1998
wpeB.jpg (687 bytes)  Advanced X-ray structural characterisation methods, head of the project, 1999-2000

wpe5.jpg (680 bytes)  Current:

wpeB.jpg (687 bytes)  C27/2001 "Masuratori de zgomot electronic n nanomateriale: o noua metoda de investigare", M. Mihaila, MAZELTOV project, MATNANTECH Program.
wpeB.jpg (687 bytes)  C558 "Neuron optic reconfigurabil - cercetare, experimentare, demonstrator si evaluare parametrii functionali", G. Moagar-Poladian, MATNANTECH Program (2001-2004);
wpeB.jpg (687 bytes)  "Development of technologies for preparation and patterning of nanostructured AlN thin films, with piezoelectric properties", National Programm MATNANTECH (2002-2005);
wpeB.jpg (687 bytes)  MINAMAT-NET Chartacterization of Materials and Structures for Micro and Nanoengneering Research Laboratory Network (MINAMAT-NET)- National Project 2001-2004
wpeB.jpg (687 bytes)  Technologies for realization of Fabry-Perot micro-interferometers integrated on silicon - National Project 2001-2004

Blue_Arrow25D.gif (140 bytes)  General activities in the projects mentioned above:

wpe5.jpg (680 bytes)  X-ray analysis methods of crystalline samples, from mixed amorphous-crystalline phases to bulk monocrystalline ones (see above).
wpe5.jpg (680 bytes)  X-ray analysis of LPCVD polysilicon layers (texture calculation, grain size, effect of low low temperature annealing on cristallinity, texture and grain size);

Buton.jpg (695 bytes)  Main scientific publications:

wpe5.jpg (680 bytes)  "Structural investigation of LPCVD poly-silicon layers used in surface micromachining", M. Danila, E. Manea, R. Muller, R. Gavrila, CAS 2002;
wpe5.jpg (680 bytes)  "Nonlinear Conduction in Platinum Nanoparticle Films", M.Mihaila, C.Grigoriu, M. Danila, F. Craciunoiu, R. Gavrila,D. Steriu, G. Stanciu, D. Ursutiu, G. Dragan and I. Dinoiu, Proc. IEEE Int. Semiconductor Conf., CAS'2002, Sinaia, Oct. 2002, pp. 115-118;
wpe5.jpg (680 bytes)  "Structural and Optoelectrical Investigation of Transparent and Conductive ZnO Thin Films Prepared by Chemical Vapor Deposition", M. Purica, E. Budianu, E. Rusu ,M. Danila, R. Gavrila, Proceedings CAS'2000, pg.159., Best paper award;
wpe5.jpg (680 bytes)  "Design and OptimiZation of a MSM Photodetector based on poly-Si layer", E.Budianu, M.Purica, E.Manea, M. Danila, R.Gavrila, I.Oprea, CAS'2001, pg.181, Best paper award;
wpe5.jpg (680 bytes)  "Microphysical investigation of low temperature annealed LPCVD polysilicon films", C. Cobianu, M. Modreanu, M. Danila, M. Bercu, R. Gavrila, and M. Gartner, CAS'2001, pg.511;
wpe5.jpg (680 bytes)  "LIGA and alternative tehniques for microoptical components", N.Moldovan, M.Ilie, N.Dumbravescu, M. Danila, A.Vitriuc, P.Sindile, J.Mohr, Annual Conference for Semiconductors, Sinaia, Proceedings of CAS, 1997, p.149-152.
wpe5.jpg (680 bytes)  "Structural and morphological changes in low temperature annealed LPCVD Si layers", C. Cobianu, M. Modreanu, M. Bercu, M. Danila, R. Gavrila, and M. Gartner, Journal de Physique IV 2001 vol.11 Pr.3 315-324;
wpe5.jpg (680 bytes)  "Optical improved structure of polycristalline silicon based thin film solar cell", E. Budianu, M. Purica, E. Manea, E. Rusu, R. Gavrila, M. Danila, EMRS 2001, Strasbourg, Solar Energy Materials and Solar Cells;
wpe5.jpg (680 bytes)  "Optical and Structural Investigation of Transparent and Conductive ZnO Thin Films Prepared by Chemical Vapor Deposition", M. Purica, E. Budianu, E.Rusu, M. Danila, R.Gavrila, EMRS2001-Strasbourg, Thin Solid Films 2001;
wpe5.jpg (680 bytes)  "Microstructural information from optical properties of LPCVD silicon films annealed at low temperature", M. Gartner, M. Modreanu, C. Cobianu, R. Gavrila, M. Danila, Sensors&Actuators A 99 (2002), pg.160-164;
wpe5.jpg (680 bytes)  "Nonlinear Conduction in Platinum Nanoparticle Films", M.Mihaila, D.Ursutiu, C.Grigoriu, M.Danila, F.Craciunoiu, R.Gavrila, National Science Foundation (NSF) Workshop on "Communication and Integration in Nanomaterials", Brasov, 30 oct. -2 sept., 2002;
wpe5.jpg (680 bytes)  "NONLINEAR CONDUCTION IN PLATINUM NANOPARTICLE FILMS", M.Mihaila, C.Grigoriu, M. Danila, F. Craciunoiu, R. Gavrila,D. Steriu, D. URSUTIU, in Proceedings of The Romanian Academy, series A(Mathematics, Physics, Information Science), 2003(in press).
wpe5.jpg (680 bytes)  "Substrate-induced 1/f Noise in Platinum Nanoparticle Films", M.Mihaila, D.Ursutiu, C.Grigoriu, M. Danila, F. Craciunoiu, R. Gavrila, D. Steriu, accepted at the 17th International Conference on Noise and Fluctuations, August 2003, Prague.

Buton.jpg (695 bytes)  Member of professional associations: CNCAN authorised personal.

Buton.jpg (695 bytes)  Additional information: X- ray analysys methods , techniques and programming (software design).

Buton.jpg (695 bytes)  Foreign languages: English, French- very good, Itallian, spanish - good

Buton.jpg (695 bytes)  Contact information:

wpe5.jpg (680 bytes)  E-mail  mihaid@imt.ro
wpe5.jpg (680 bytes)  Phone; +40 - 21-490.82.12, ext. 32; Fax: +40 - 21-490.82.38;
wpe5.jpg (680 bytes)  Normal mailing address: P.O.Box 38-160, Bucharest, Romania,  32B Erou Iancu Nicolae Street, Bucharest, Romania

wpe3.jpg (1942 bytes)