First name: Constantin
Date and place of birth: April 07, 1969 / Tg. Neamt, Romania
B.Sc. in Physics - University of Bucharest. Degree in Optics, Spectroscopy, Plasma and Laser Physics,1998;
M.Sc. in Physics - University of Bucharest. Degree in Plasma and Lasers, 2000.
Micro electro-mechanical systems (MEMS) modeling and analysis using CoventorWare integrated suite of tools designed to produce accurately-modeled MEMS design
Raman Spectroscopy (My M.Sc. thesis was devoted to the study of Raman scattering by optical phonons in mono-crystalline silicon);
Career: Since 1998 I have been working in the National Institute for R&D in Microtechnologies (IMT) - Bucharest.
Stages abroad: Conventor BV-Amsterdam, Netherlands, one week, 2001 (training on ConventorWare integrated suite of tools)
Present position: junior researcher
Research interests: microphysical characterization of semiconductor devices, MEMS-design, modeling and simulation.
Past and current projects: Participant in research projects of national programs CALIST and MATNANTECH.
Main scientific publications:
L. Galateanu, C. Tibeica, F. Turtudau - "Building Reliability Monitors for Power Semiconductor Devices", International Semiconductor Conference - CAS 2000 Proceedings, vol.1, pp. 263-266
L. Galateanu, C. Tibeica, F. Turtudau, "Analize statistice pentru stabilirea unor monitori de fiabilitate", Optimum Q, nr. 3-4, 2000, pp. 15-19
L. Galateanu, M. Bazu, C. Tibeica, E. Popa, A. Nichita, F. Turtudau - "Optimizing the Double Diffusion Process for Power Diodes Manufacturing", International Semiconductor Conference - CAS 2001 Proceedings, vol. 2, pp. 477-480
L. Galateanu, C. Cobianu, D. Apostol, V. Damian, C. Tibeica - "Detection of Deep Level Generation - Recombination Centers in Silicon Transistor by Laser Irradiation" - International Semiconductor Conference - CAS 2002 Proceedings, vol. 2, pp. 351 - 354
L. Galateanu, M. Bazu, C. Tibeica, E. Popa, A. Nichita, F. Turtudau - "New Control Methods and Process Monitoring for Improving Performances of Power Diodes Manufacturing" - International Semiconductor Conference - CAS 2002 Proceedings, vol. 2, pp. 347 - 350
L. Galateanu, M. Bazu, C. Tibeica, E. Popa, A. Nichita, F. Turtudau - "Process Monitoring on Reliability Criteria for Power Diodes Manufacturing" - CCF 2002
Member of professional associations:
Foreign languages: English, French
Contact information: e-mail: firstname.lastname@example.org; Office phone:+40-21-490.82.12, ext. 33; Home phone:+40-21-413.45.65