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Estimated Results   

  • Research equipments acquisition: Raman spectrometter, x-y maping module for elipsometer, optical spectrum analyzer, radiometer/photometer, coherent sources, digital multimetres.
  • Method for determination of optical constants (n,k), thickness and composition of multiple nanometer layers by spectrophotometric techniques – spectral elipsometry, Raman elipsometry.
  • Development and implementation the methods for characterization of optoelectronic and photonic components: spectral characteristics ; photoresponse determination of the detecting and emitting optoelectronic devices; spectral distribution for emitting devices.