CV Researchers home


  First name: Adrian

  Surname : Dinescu

  Date and place of birth: 20.08.1968 , Brasov, Romania

  Education :

wpe5.jpg (680 bytes)  1987-1993, Graduated in " Solid State Physics", Faculty of Physics, University of Bucharest.
wpe5.jpg (680 bytes)  Ph.D. fellow, University of Bucharest, Faculty of Physics

  Professional experience: Optoelectronics, Atomic Force Microscopy

  Career :

wpe5.jpg (680 bytes)  1993-1996 ICCE Bucharest, scientific researcher
wpe5.jpg (680 bytes)  1997-2003 IMT Bucharest, scientific researcher

  Research interests: Scaning Probe Microscopy, Optoelectronic components

  Past and current projects :

wpe5.jpg (680 bytes)  High Efficiency Silicon Solar Cells, 1994-1996, head of project
wpe5.jpg (680 bytes)  Silicon Compatibles Technologies for Photodetectors, 1995-1996, head of project
wpe5.jpg (680 bytes)  Photodetectors with controlled Spectral Caharacteristics, 1997-1998 , head of project
wpe5.jpg (680 bytes)  Force Sensors for Atomic Force Microscopy, 2002-present , head of project

  Main scientific publications

wpe5.jpg (680 bytes)  A. Dinescu, R. Gavrila, REFLECTIVITY DECREASE IN TEXTURED SILICON SURFACES USING MICROGROOVES AND INVERTED PYRAMIDS, Proceedings Supplement of the BPL , volume 5 , 2202 –2205, 1997
wpe5.jpg (680 bytes)  M. Negreanu , R. Gavrila, A. Dinescu, TAPERED WINDOWS IN SILICON DIOXIDE LAYERS FOR MASKING AND PASIVATION-OBTAINING AND CHARACTERIZATION METHODS, International Semiconductor Conference -CAS '97, Sinaia, Romania", 243 - 246 (1997)
wpe5.jpg (680 bytes)  A. Dinescu, S. Nastase, R. Gavrila, R. Radoi, St. Iovan, COMPARATIVE STUDY OF MORPHOLOGIC FEATURES INVESTIGATED ON SILICON OXIDE THIN FILMS USING SPECTRO-ELLIPSOMETRY AND AFM , 18th European Conference on Surface Science Conference, Wien, Austria, 1999
wpe5.jpg (680 bytes)  Dinescu A., Radoi R., Gavrila R., Tanase S., Negoiu D. , SURFACE MORPHOLOGICAL FEATURES OF NANOCRYSTALLINE TITANIUM OXIDE LAYERS INVESTIGATED BY SPECTROSCOPIC ELLIPSOMETRY AND ATOMIC FORCE MICROSCOPY, 19th European Conference on Surface Science, Madrid, Spania, 2000
wpe5.jpg (680 bytes)  Dinescu A., Grecea M., Gavrila Raluca, Radoi Rodica, Craciun G. , GROWTH AND CHARACTERIZATION OF ANODIC OXIDE THIN FILMS ON SILICON SUBSTRATES FORMED IN PHOSPHORIC ACID, 2nd International Conference On «Chemical Sciences For Sustainable Development», Halkidiki , GREECE, 2000
wpe5.jpg (680 bytes)  A. Dinescu, M. Danila, E. Manea, R. Muller, R. Gavrila, STRUCTURAL INVESTIGATION OF LPCVD POLY-SILICON LAYERS USED IN SURFACE MICROMACHINING, acceptata pentru CAS 2002
wpe5.jpg (680 bytes)  A. Dinescu, I. Oprea, R. Gavrila, R. Oprica, DETERMINATION OF SCANNING PARAMETERS IN INTERMITTENT CONTACT OPERATION MODE AFM, International Semiconductor Conference - CAS 2001, Sinaia, Romania

  Foreign languages: English, French

Contact information

wpe5.jpg (680 bytes) E-mail:;
wpe5.jpg (680 bytes) Tel.: +40-21-490.84.12, +40-21-490.82.12 / 32;
wpe5.jpg (680 bytes) Mailing address: 32B, Erou Iancu Nicolae Street, R-72996, Bucharest, ROMANIA



top of page

Last update: May 25, 2005