CURRICULUM VITAE
First name: Lucian
Alexandru
Surname: Galateanu
Date and place of
birth: 20.11.1947, Iasi, Romania
Education:
M.Sc., University Politehnica
Bucharest, Faculty of Electronics & Tc., 1970;
Ph.D., University Politehnica
Bucharest, Reliability Physics, 1993.
Professional
experience:
Design and technology
improvements for semiconductor devices, in order to be used in special reliability
applications;
Microphysical characterisation
and defect diagnosis for semiconductor devices;
Reliability tests: new models,
original in situ reliability tests and reliability monitors, new design methods of
accelerated tests for reliability screening and rapid reliability evaluation.
Career:
| Period: |
1978
- 1990
|
1990
- 1996
|
1996
- present
|
| Employers: |
ICCE
Bucharest
|
ICCE
Bucharest
|
IMT
Bucharest
|
| Job: |
Senior
Researcher, III degree;
Head of Reliability
Research Laboratory
|
Senior Researcher, II degree;
Senior Researcher, I degree,
from 1990 July.
Project Leader
|
| Description: |
Establishment
of the first research laboratory in Romania, in the field of semiconductor device
reliability; co-ordination of a complex research program directed to: i) implementing the new methods for microphysical
characterization and failure diagnosis of semiconductor devices;
- ii) modelling the acceleration with the
stress of the failure mechanisms and designing the reliability tests;
iii) establishing the technological and
design optimization for diminishing the failure mechanisms;
iv) obtaining semiconductor devices for
special reliability requirements.
|
Achievement of some research projects, funded by National R&D
Programs, as ORIZONT 2000, CALIST, MATNANTECH or by International R&D Programs, as
PHARE - TTQM, having the following main results: i) new methods for designing the accelerated tests used for screening the
reliable devices and for rapid reliability certification of the semiconductor fabrication
batches used in the Nuclear Plant Equipment;
iii) new in situ testing methods
for "building-in reliability" approach;
iv) new reliability monitors for
optimisation the technological processes on reliability criteria;
v) significant improvements of fabrication
yields for higher device performances, in the field of power device manufacturing;
vi) significant improvements of the device
reliability, special for automotive diodes;
vii) new, special test for reliability
screening at chip fabrication processes level.
|
Stages abroad: USA,
Boston, Technologies Associates, specialization on "Accelerated Life Testing",
1986.
Present position: Senior
Researcher in the Reliability Laboratory of National Institute for Research and
Development in Microtechnologies (IMT-Bucharest).
Research interests: Testing
methods, reliability physics, in situ techniques for "building-in reliability"
approach, reliability evaluation and improvement for semiconductor devices and
microsystems.
Past and current
projects:
"Selective acceleration of
semiconductor chips ageing by laser irradiation", National MATNANTECH R&D
Programme, 2001-2004, reducing the fabrication costs by screening and packaging the
reliable chips, project leader;
"New control and test
methods for improving the process performances of power semiconductor manufacturing",
National CALIST R&D Programme, 1999-2002, significant improvements of fabrication
yields for higher device performances, project leader;
"New techniques for
reliability evaluation of electronic components", IMT Bucharest and IMO, Limburgs
Universitair Centrum, Belgium bilateral co-operation, 1998-2000, new in situ
techniques for reliability monitoring, project leader;
"Building-in
Reliability" for Diodes Manufacturing", Phare - TTQM Programme, 1997-1999, new
reliability monitors and reliability improvements, member of the team.
Main scientific
publications:
17 papers, published in
international journals (a selection):
L. Galateanu, C. Tibeica, F.
Turtudau, "Statistical analyses for reliability monitors establishment", Optimum
Q, nr. 3-4, pp. 15-19, 2000.
L. Galateanu, M. Stoica, E. Popa,
"Strain depending reliability of automotive diodes", Microelectronics
Reliability, vol 38, pp. 1331-1334, 1998.
L. Galateanu, "In Situ Ageing,
a Development of "In Situ" Techniques for Building-in Reliability", Microelectronics
and Reliability, vol.37, nr.10 – 11, pp.1639 – 1642, 1997.
58 scientific papers, published
in Proceedings of international conferences (a selection):
L. Galateanu, C.Cobianu, D.Apostol,
V.Damian, C. Tibeica, "Detection of deep level generation-recombination centers in
silicon transistor by laser irradiation", International Semiconductor Conference (CAS'02),
Sinaia, Oct. 2002, Proceedings pp.351-354.
L. Galateanu, M. Bazu, C. Tibeica,
E. Popa, A. Nichita, F. Turtudau, "New control methods and process monitoring for
improving performances of power diodes manufacturing", International Semiconductor
Conference (CAS'02), Sinaia, Oct. 2002, Proceedings pp.347-350.
L. Galateanu, M. Bazu, C. Tibeica,
E. Popa, A. Nichita, F. Turtudau, "Optimizing the double diffusion process for power
diodes manufacturing", International Semiconductor Conference (CAS'01),
Sinaia, Oct. 2001, Proceedings pp. 477-480.
L. Galateanu, C. Tibeica, F.
Turtudau, "Building Reliability Monitors for Power Semiconductor
Devices", International Semiconductor Conference (CAS'00), Sinaia,
Oct. 2000, Proceedings pp. 263-266.
L. Galateanu, E. Stanila, E.
Vasile, "Modeling the laser acceleration of hot spot formation", International
Semiconductor Conference (CAS'99), Sinaia, Oct. 1999, Proceedings pp. 235-238.
L. Galateanu, M. Stoica, E. Popa,
"Strain depending reliability of automotive diodes", ESREF'98, Copenhagen,
1998.
L. Galateanu, F. Baicu, "A
Design Method of Accelerated Aging Tests for Screening Reliable Semiconductor Devices Used
in Life Qualified Equipment", International Conference on Nuclear Engineering (ICONE
– 5), Nice, June 1997, CD ROM Proceedings, 7.6 Section, 2247 doc.
L. Galateanu, "In Situ Ageing,
a Development of "In Situ" Techniques for Building-in Reliability",
ESREF'97, Bordeaux, 1997.
Member of professional
associations:
Founding member and Scientific
Secretary of Romanian Reliability Society;
Founding member of Romanian
Foundation for Quality Promotion;
Member of General Association
of Engineers from Romania.
Additional
information:
National award: "Excellency
in research - 2000", in the field of diagnosis, design and technological optimisation
for quality, reliability and yield improvements of Romanian power device manufacturing.
Foreign languages:
English, French
Contact information:
[email protected]
