First name: Virgil Emil
Date and place of birth: 16/11/1947 Cluj Napoca
Education (B.Sc. / M.Sc. / Ph.D.; institution, specialization, year of graduation):
M.Sc., University Politehnica Bucharest, Fac. Electronics & Tc., 1971
Professional experience (competence and domain):
Reliability of microelectronic devices, design, characterization and testing of electronic components.
Career (employers, jobs, time periods; selection - mainly related to the present job):
Present position: He is a Senior Researcher in the Reliability and Quality Assurance Laboratory from National Institute for Research and Development in Microtechnologies (IMT-Bucharest).
Research interests: Testing methods, failure physics for microsystems & microelectronic devices, reliability assurance, reliability prediction, use of computational intelligence methods for reliability assessment of microsystems.
Past and current projects:
Recent involvement in projects concerning on building-in reliability (Phare - TTQM project 1997-1999) - member of the team, studies of microsystems behavior in electric and mecano-climatic hostile environment for automotive application (1999-2000) - project leader, evaluation of semiconductor devices ageing from detector amplifier used in nuclear power plants equipment (1999-2002) - project leader.
Main scientific publications:
Author or co-author of more than 40 scientific papers and contributions to conferences.
Evaluation of Semiconductor Devices Ageing from In Core Flux Detector Amplifier Used in Nuclear Power Plants Equipment, Virgil E.Ilian*, Maria Dragan*, Marius Bazu*, Marcel Oprea**, Irina Oprea**, Mihai Stoica**, Ion Parvu**, Sinaia, Romania, CAS 2002 (*IMT, **Subsidiary for Nuclear Research Pitesti - SCN Pitesti)
Design and manufacturing of a multichannel microprobe for electronical activity recording of neural cells, C. Moldovan, V. Ilian, R. Iosub, M. Modreanu, I. Dinoiu, B. Firtat, Sinaia, Romania, CAS 2001
Building a test schedule for automotive microsystems using accelerated testing models, V. E. Ilian, Maria Dragan, M. Bazu, G. Socol, Sinaia, Romania, CAS 2001
A method for evaluating occupational esposures during invasive angiography procedures by using solid state detectors, E.Halmagean, D.Loukas, M.Iacob, A.G.Karydas, V.E.Ilian, Radiation Protection Dosimetry, vol.85, Nos.1-4, pp. 413-415 (1999), Nuclear Technology Publishing
Circuite integrate cu functia de autotestabilitate inclusa. V.E.Ilian, SACF, Bucuresti, nov.1996
Module calificabile īn procesul de realizare a circuitelor integrate. V.E.Ilian, SACF, Bucuresti, nov.1994
Circuit integrat tolerant la defectari. V.E.Ilian, SACF, Bucuresti, nov.1993
Modelarea accelerarii mecanismelor de defectare ale dispozitivelor semiconductoare cu umiditatea, temperatura si cāmpul electric. V.E.Ilian, SACF, Bucuresti, nov.1992
Accelerated testing of IC 's after a long term storage. M.Bazu, V.E.Ilian, SRE Symposium, Nykoping (Suedia), oct. 1990.
Member of professional associations: SRF (Romanian Reliability Society), CER (Romanian Electrotechnical Committee)
He is also an active part in the field of standardization, as the president of TC 47 "Semiconductor Devices" and TC 91 "Electronics Assembly Techniques" of CNR CEI. In 1995 he received the Award "Dragomir Hurmuzescu" for the excellence in the field of standardization.
Foreign languages: english, french
Contact information (e-mail, tel., fax. mailing address): firstname.lastname@example.org