The spectrophotometer SPECORD M42 with double spot and (200 – 900) nm spectral range contains modules for transmitance and reflectance measurements and enables data acquisition by a PC in order to processing of the measured data with specific softwares. The equipment operates in any transparent ambient, including vacuum, gases and air.
The equipment can be used for:
· optical characterization by recording the transmission and absorbtion spectra for transparent samples and for solutions with +/- 0.3 nm precision in wavelength;
· thin films characterization by recording the transmistance, absorbance spectra [T(λ) , A(λ) ] and the reflectance, R(λ) used for optical coatings;
· surface reflectivity characterization of the texturized and porosified surfaces,
· material properties: the absorption coefficient and the bandgap for the semiconductor and dielectric films obtained by processing of T(λ) and R(λ).