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EXPERIMENTAL LABORATORIES in the characterization area

 

Ultra high resolution triple axis multiple reflection SmartLab X-ray Thin film Difraction System (Rigaku Corporation, Japan) [details...] – contact persons: Mihai Danila, Cosmin Romanitan

   
 

Microarray spot plotting and scanning using: Micro-Nano Plotter – OmniGrid - and Microarray Scanner - GeneTAC UC4 (Genomic Solutions Ltd., UK) [details...]contact person: Monica Simion

   
 

Scanning Electrochemical Microscope - ElProScan (HEKA, Germany) [details...]contact person: Mihaela Kusko, Monica Simion, Melania Banu

   
  Electrochemical Impedance Spectrometer - PARSTAT 2273 (Princeton Applied Research, USA) [details...]contact person: Mihaela Kusko
   
  Zeta Potential and Submicron Particle Size Analyzer - DelsaNano (Beckman Coulter, USA) [details...] contact persons Adina Boldeiu, Teodora Ignat
   
  Combined Time Resolved and Steady State Fluorescence Spectrometer - FLS920P (Edinburgh Instruments, UK) [details...] contact person Iuliana Mihalache
   
  Noise and phonon fluctuation spectroscopy measurement system – New measurement system [details...](designed and realized in 2016, in the TEHNOSPEC project frame)- contact person: Mihai Mihaila
   
  Surface Plasmon Resonance instrument AUTOLAB – Twingle (Metrohm Autolab BV) [details...]- contact person: Antonio Radoi, Pericle Varasteanu
   
  Automated Dip Coater (MTI Corporation, USA) [details...]- contact person: Adina Boldeiu
   

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Last update: August, 2017