LABORATOR DE ANALIZE MORFOLOGICE LA SCARA NANOMETRICA

NANOMORPH

 
RESURSE
English Version
last update - Mai 2009

RESURSE

  • Pliant NANOMORPH [...]
  • Microscop SPM (Scanning Probe Microscope) de inalta performanta (in curs de achizitie)
  • Microscop electronic TESCAN VEGA LMU
  • Microscop AFM home-made

Microscop SPM (Scanning Probe Microscope) Ntegra Aura (NT-MDT)

Caracteristici:

• domeniul de scanare: 100x100x10 μm
• dotat cu senzori capacitivi
• nivel de zgomot: XY: 0,3 nm, Z: 0,06 nm
•  nelinearitate X, Y in modul closed-loop     < 0.15 %.

Microscop Electronic de Baleiaj (SEM) Vega II LMU (Tescan)

Caracteristici:

• rezolutie: 3 nm @ 30 kV
• tensiune de accelerare: 200V-30 kV
• tun electronic: filament W
• marire: 13X – 1.000.000X
• detectori: SE, BSE, LVSTD
Microscop AFM home-made