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EXPERIMENTAL LABORATORIES in the characterization area

Ultra high resolution triple axis multiple reflection SmartLab X-ray Thin film Difraction System (Rigaku Corporation, Japan) [details...] – contact persons:Cosmin Romanitan


	Microarray spot plotting and scanning using: Micro-Nano Plotter – OmniGrid - and Microarray Scanner - GeneTAC UC4 (Genomic Solutions Ltd., UK) *[details...]* – contact persons: *Monica Simion, Melania Popescu, Larisa Gogianu*


	Scanning Electrochemical Microscope - ElProScan (HEKA, Germany) *[details...]* – contact person: *Alexandru Bujor*


	Electrochemical Impedance Spectrometer - PARSTAT 2273 (Princeton Applied Research, USA) *[details...]– contact person: Mihaela Kusko, Irina Bratosin*


	Zeta Potential and Submicron Particle Size Analyzer - DelsaNano (Beckman Coulter, USA) *[details...]* – contact persons Adina Boldeiu


	Combined Time Resolved and Steady State Fluorescence Spectrometer - FLS920P (Edinburgh Instruments, UK) *[details...]* – contact person *Iuliana Mihalache*

	Noise and phonon fluctuation spectroscopy measurement system – New measurement system *[details...](designed and realized in 2016, in the TEHNOSPEC project frame)- contact person:* Mihai Mihaila

	Surface Plasmon Resonance instrument AUTOLAB – Twingle (Metrohm Autolab BV) *[details...]- contact person:* Antonio Radoi, Pericle Varasteanu

	Automated Dip Coater (MTI Corporation, USA) *[details...]- contact person:* Adina Boldeiu