CAS 2023 Programme
Common Opening session CAS 2023 and AVIC 2023, 11 Oct. 2023, 08:50 a.m. (CAS 2023 is co-located with the 2023 International Conference on Analog VLSI Circuits - AVIC 2023)
WELCOME TO CAS 2023, Dr. Mircea Dragoman, IMT Bucharest, Romania
WELCOME TO AVIC 2023, Dr. Pat Cunneen, Analog Devices, Ireland
CAS 2023 conference program includes on Wednesday, Oct. 11, a special Round table "The Microelectronics Ecosystem In Romania - Current Status, Challenges, And Perspectives", where members of the broader community from Academia, RTOs, Industry, Finance, and funding bodies will discuss the current challenges and opportunities in this national, European and global interest field, a key enabler for the development of future technologies.
On October 12, the Networking Centre For Excellence In Nanoelectronics For Environment Monitoring will be launched. The Centre is part of the Horizon Europe project “NET4Air: A Networking Center for excellence in Nanoelectronic Devices for Air Monitoring” coordinated by IMT Bucharest.
This year, the CAS conference is accompanied by satellite events and training schools organised in the frame of EU-funded projects:
- In the days preceding the CAS conference, IMT in cooperation with the EuroNanoLab consortium organizes the Dry Etch Expert Meeting. The event brings together top experts from Europe and process engineers, with the aim of establishing collaboration programs, as well as programs for professional training and human resource development in the field.
- On October 14, 2023, h 09:30 - 16:00, the NET4Air' School on Environmental Sensors will take place. The event is organised in the frame of the Horizon Europe project NET4Air, grant agreement no.101079455.
Join Park's talk at the CAS 2023
“Enhancing your nanoscale semiconductor metrology with Park Systems AFMs”
When: Thursday October 12, 2023 between 09:00 and 11:00 am
Presenter: Dr. Elena Arbelo, Market Development Manager Europe, Park Systems Europe, Germany
Author: Dr. James Kerfoot, Application Scientist at Park Systems United Kingdom
Read the full Abstract